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The D8 DISCOVER is the flagship multi-purpose X-ray diffractometer offering leading technology components. It is designed for the structural characterization of the full range of materials from powders, amorphous and polycrystalline materials to epitaxial multi-layered thin films at ambient and non-ambient conditions. Phase Identification and quantification, structure determination and refinement, Micro strain and crystallite size…
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The D8 DISCOVER is the flagship multi-purpose X-ray diffractometer offering leading technology components. It is designed for the structural characterization of the full range of materials from powders, amorphous and polycrystalline materials to epitaxial multi-layered thin films at ambient and non-ambient conditions.
Phase Identification and quantification, structure determination and refinement, Micro strain and crystallite size analysis,
X-Ray reflectometry, Grazing Incidence Diffraction (GID), In-Plane Diffraction, High-resolution XRD, GISAXS, GI-Stress analysis, crystal orientation analysis
Residual Stress analysis, Texture and pole figures, micro X-ray Diffraction, Wide Angle X-ray Scattering (WAXS),
Total scattering analysis: Bragg Diffraction, Pair-Distribution Function (PDF), Small Angle X-Ray Scattering (SAXS)
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