loader image

NeXT GENERATION – PARTICLE MEASUREMENT BY LASER DIFFRACTION

Add to Wishlist
Add to Wishlist

REPRODUCIBLE ANALYSIS OF PARTICLE SIZE AND SHAPE Static Light Scattering – perfect for particle sizing from 0.01 to 3800 µm! With the completely revised ANALYSETTE 22 NeXT you choose according to your requirements: The ANALYSETTE 22 NeXT Micro with a measuring range of 0.5 – 1500 μm for all typical measurement tasks or the high-end…

REPRODUCIBLE ANALYSIS OF PARTICLE SIZE AND SHAPE

Static Light Scattering – perfect for particle sizing from 0.01 to 3800 µm!

With the completely revised ANALYSETTE 22 NeXT you choose according to your requirements: The ANALYSETTE 22 NeXT Micro with a measuring range of 0.5 – 1500 μm for all typical measurement tasks or the high-end instrument ANALYSETTE 22 NeXT Nano with an extra wide measuring range of 0.01 – 3800 μm for maximum precision and sensitivity for smallest particles with an additional detector system.

The Laser Particle Sizers ANALYSETTE 22 NeXT are used worldwide in production and quality control, in research and development for the precise measurement of particle sizes of solids, suspensions and emulsions.

Dynamic Image Analysis – particle shape and size analysis in a wide measuring range 5 µm – 20 mm!

The Particle Sizer ANALYSETTE 28 ImageSizer is ideal for particle shape and size analysis of powders and bulk solids as well as emulsions and suspensions.

Use the product finder and you will find fast and easy the perfect instrument for your application.

Cat – https://www.fritsch-international.com/fileadmin/Redakteur/Downloads/Reports_sizing/Application_Examples/The_NeXT_Generation.pdf

Reviews

There are no reviews yet.

Be the first to review “NeXT GENERATION – PARTICLE MEASUREMENT BY LASER DIFFRACTION”

Your email address will not be published. Required fields are marked *